Understanding Nickel Thin Film crystallization using X-Ray Diffractometry
نویسندگان
چکیده
منابع مشابه
In Situ Thin Film Crystallization Studies Using High Temperature Grazing Incidence X-ray Diffraction (htgixrd)
We describe the experimental procedure and use of high-temperature X-ray diffraction techniques combined with grazing-incidence optics for in situ crystallization studies on several polycrystalline thin films; this technique is referred to as High-Temperature Grazing Incidence X-Ray Diffraction or (HTGIXRD). Temperature calibration techniques, sample positioning issues, and limitations of this ...
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ژورنال
عنوان ژورنال: Journal of Applied Sciences and Environmental Management
سال: 2010
ISSN: 1119-8362
DOI: 10.4314/jasem.v11i2.54986